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Impact of GEM foil hole geometry on GEM detector gain

机译:GEM箔孔几何形状对GEM检测器增益的影响

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摘要

Detailed 3D imaging of Gas Electron Multiplier (GEM) foil hole geometry was realized. Scanning White Light Interferometry was used to examine six topological parameters of GEM foil holes from both sides of the foil. To study the effect of the hole geometry on detector gain, the ANSYS and Garfield ++ software were employed to simulate the GEM detector gain on the basis of SWLI data. In particular, the effective gain in a GEM foil with equally shaped holes was studied. The real GEM foil holes exhibited a 4% lower effective gain and 6% more electrons produced near the exit electrode of the GEM foil than the design anticipated. Our results indicate that the GEM foil hole geometry affects the gain performance of GEM detectors.
机译:实现了气体电子倍增器(GEM)箔孔几何结构的详细3D成像。扫描白光干涉法用于从箔片的两侧检查GEM箔片孔的六个拓扑参数。为了研究孔的几何形状对探测器增益的影响,基于SWLI数据,使用ANSYS和Garfield ++软件来模拟GEM探测器增益。特别地,研究了具有相同形状的孔的GEM箔中的有效增益。实际的GEM箔孔显示出比设计预期低4%的有效增益和在GEM箔的出口电极附近产生的电子多6%。我们的结果表明,GEM箔孔的几何形状会影响GEM检测器的增益性能。

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